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Semiconductor Day

Electrical Characteristics Evaluation

semElectrical measurements were made with nitrogen, unless otherwise specified. Glove box with oxygen water concentration less than 3 ppm 2 ppm each. For multiple devices on the same board, each unit has a separate. To pay close attention to each other and realize this, Individual devices (contact for semiconductor or gold ITO). Current voltage measurements were made in the dark using hand tools. Combines the probe station and the Keithley 4200-SCS parameter analyzer. Pre-structural substrates. I got a call from a special contact card. The impedance spectroscopy was changed using the ModuLab Impedance Analyzer in the following ways -Solar electronic analysis. The measurement was made in the following 4-point probe modes -connects close to possible devices. The climate measurement is as follows - Connect the probe stations of two probes directly to each contact. Depending on the temperature, the measurement was changed to a specially designed holder.
Two probes were connected externally. amplitude of perturbation. The rash was set to 200 mV.

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